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Showing results: 451 - 465 of 525 items found.

  • Wafer Probe Loadboards/PIB

    Dynamic Test Solutions

    DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.

  • Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points

    LEON Fixture - Konrad Technologies GmbH

    The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.

  • Load Cells

    WIKA Alexander Wiegand SE & Co. KG

    Load cells are designed as a special form of force transducer for use in weighing equipment. These force transducers enable very high measurement accuracies of 0.01 % and 0.05 % of FS. Load cells are used in the widest variety of application areas, including platform, filling, belt and packaging scales, dynamic test systems as well as electronic precision, price-labelling and industrial scales. WIKA provides you with all typical and widely used load cell geometries such as single point load cells, bending and shear beam load cells, s-type load cells, canister load cells and compression force load cells. In addition, there are corresponding mounting kits and complete weighing modules available.

  • General Data Acquisition Device With Strain Gage Measurement

    Spider-80SG - Crystal instruments

    The Spider-80SG is a high precision, general purpose data acquisition device featuring strain gage measurement. This device can be used in a variety of physical and measurement tests. The Spider-80SG can acquire data from a strain gage or a wide range of measurement quantities. A variety of general purpose and strain gage based sensors are supported. The Spider-80SG is built on the proven outstanding performance and reliability of Crystal Instruments’ DSP-based hardware platform. It features the same form factor as other Spider-80X front-ends from Crystal Instruments and can be configured into one measurement system with excellent compatibility and scalability. This gives the Spider-80SG capabilities to reliably acquire data from multiple sensors and for multiple measurement quantities simultaneously.

  • Ethernet

    Teledyne LeCroy

    Ethernet, arguably the most common communication protocol on the planet, continues to spread into new markets and incorporates new protocols; it presents today’s Ethernet engineers with host of new test and validation challenges. Specifically, the increasing adoption of lossless Ethernet standards like FCoE, RoCE, and NVMf and increases in the line-rates of Ethernet from 10GbE and soon to 100Gb/s to name a few.These new physical and logical communications standards have exposed legacy test tools as outdated and incomplete for Ethernet product developers and the ecosystem. Teledyne LeCroy is addressing these needs by leveraging our extensive experience in high-speed serial data analysis tools currently used by many of the same companies developing products for NAS, SAN, LAN, and other high-speed protocol environments.The SierraNet Family of Ethernet test platforms provides best in class traffic capture, analysis, and manipulation for testing physical link characteristics and application operations. SierraNet is designed for addressing today’s high-speed storage and communications network problems and compliments other tools offering industry leading visibility and utility.

  • DIGITAL TURNS TESTER AND DIGITAL LCRTZ METER

    TURNS-LCRTZ - Vasavi Electronics

    Digital TURNS TESTER with LCR for Counting / Measuring Number of Turns for Toroidal Coils , Current Sensor , Current Transformer , Round Core Coils. Can measure, Turns along with Winding Polarity , DC Resistance , Inductance (L), Capacitance (C), DC Resistance, Rac, Q, D, ESR and Tan.Toroidal Turns Platforms :TTPT100 : 5 T - 1000 T , TTPT1000 : 500T-10000 T The Platform has 2 connections for the coil and 2 for the probe wire. Measurement principle is based on dynamic comparison of the voltage across one turn and the coil. You will be able to get the polarity or winding indication with respect to the one turn reference.Accuracy : + 0.2% + 0.5T for high and medium permeability cores at suitable test frequency. Internal Diameter must be able to pass a wire as thin as 0.2 mm. External Diameter as high as 200 mm.Test Frequency Selectable in Step : 50 Hz, 100 Hz , 500 Hz, 1 KHz, 5 KHz, 10 KHz. Test Voltage adjustable : 100mV to 1V in steps of 50mV.

  • Interface

    RP-708 - Abaco Systems Inc

    The RP-708 is a two-channel ARINC 708 weather radar display data bus PMC module interface, supporting variable frame sizes for embedded applications, simulation and test. Abaco Systems provides integrated support for this module on PCI, PCIe, CompactPCI, VME, VXI and native PMC platforms. Each RP-708 channel can be configured as two transmit channels, two receive channels, or one transmit channel and one receive channel simultaneously.

  • Advanced Design System (ADS) Core

    W2200BP - Keysight Technologies

    Advanced Design System (ADS) is the flagship product from Keysight EEsof EDA, the technology and innovation leader in high-frequency, mixed-signal electronic design automation (EDA). It is the only design simulation platform that enables the co-design of IC, package and board in high-frequency and hi-speed applications. ADS seamlessly integrates system, circuit, and full 3D electromagnetic simulation with Keysight's test instrumentation to perform single pass successful electronic designs repeatedly.

  • DDoS Testing

    NimbusDDOS

    DDoS testing is a simulation of a DDoS attack performed under controlled conditions with real traffic. The goal of DDoS testing is to answer specific questions about the target environment.DDoS attacks are unique for many organizations in that they are relatively infrequent, but when they do occur they're often catastrophic. This catastrophic nature requires that a strategy be implemented to protect the organization, but a lack of real-world experience may limit the effectiveness of any solution. The infrequency of DDoS attacks often means that IT teams are developing solutions based on the "last attack" and waiting until the "next attack" to determine success. To address these challenges, NimbusDDOS created the first DDoS attack simulation platform. Our DDoS simulation services provide organizations the ability to proactively perform DDoS attack tests, using the same techniques used by real attackers. Unlike a real attack, a DDoS test is performed in a controlled manner and structured in a way to achieve the customer's objectives.

  • Tri-Temp Test Handler

    SIA-118 Series - SESSCO Technologies, Inc.

    Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB contactors for SOIC, QSOP, SSOP, QFN, TO, MEMS and other custom packages. It is ideally suited for Engineering, Qualification Lot, and small-to-medium production run with easy migration to full production capability. This is a popular model for custom applications with very low NRE. Powered by a cutting-edge 80 ns/step all integrated controller and modular programming design for easy customization.

  • Software Suite for Automated Test

    UTP Automated Test - NOFFZ Computer Technik GmbH

    Increasing product complexity, centralized test data management and different hardware platforms from different manufacturers – these are typical challenges of test software developers for which we offer specific solutions.Our test software solution is based on certified development environments such as NI TestStand, NI LabVIEW and .NET. Thanks to our expertise based on more than 30 years of experience, we have managed to create a hardware abstraction layer that serves hardware and software developers alike and improves their collaboration. At the same time, it also covers all the needs of maintenance engineers and operators.The UTP Suite for Automated Testing includes a wide range of tools for configuring, developing, analyzing, debugging, and executing test sequences. It helps you speed up your developments while maintaining a consistently high quality standard.

  • Combination Board Tester

    Qmax Test Technologies Pvt. Ltd.

    Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.

  • Wide-range Programmable DC Power Supply

    IT6900A Series - I-TECH Electronic Co., Ltd

    IT6900A series wide range programmable power supply have built-in standard RS232, USB, GPIB, RS485 and analog interface (RS485 and analog interface are just for IT6900B), support SCPI protocol, facilitate remote control, industrial PLC control and the formation of intelligent test platform. Remote compensation terminals avoid the problem of inaccurate testing caused by voltage drop on the wire.Low ripple, low noise and built-in digital voltmeter make IT6900A easy to do external measurement.IT6900A can be widely applied in DC-DC power supply module, battery charging and sensors and other test areas.

  • Inbuilt External Controller ATE with Touch Screen Features

    QT 200NXT - Qmax Test Technologies Pvt. Ltd.

    QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture

  • Computer-Based Instruments

    GT668PXIe - Guide Technology, Inc.

    GuideTech’s GT668PXIe PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 100MHz time base with NIST traceable calibration. Some of the GT668PXIe-1 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.

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